X-RAY CHARACTERIZATION OF EPITAXIAL (SR,BA)TIO3 FILMS GROWN BY PULSED-LASER DEPOSITION

Authors
QADRI SB HORWITZ JS CHRISEY DB AUYEUNG RCY KNAUSS LA
Citation
Sb. Qadri et al., X-RAY CHARACTERIZATION OF EPITAXIAL (SR,BA)TIO3 FILMS GROWN BY PULSED-LASER DEPOSITION, Surface & coatings technology, 76(1-3), 1995, pp. 348-351
Citations number
18
Categorie Soggetti
Materials Science, Coatings & Films
Journal title
Surface & coatings technology → ACNP
ISSN journal
02578972
Volume
76
Issue
1-3
Year of publication
1995
Pages
348 - 351
Database
ISI
SICI code
0257-8972(1995)76:1-3<348:XCOE(F>2.0.ZU;2-S
Abstract
Epitaxial single crystal thin films of Sr1-xBaxTiO3 (x=0, 0.2 and 0.5) have been deposited on MgO (001), SrTiO3 (001) and LaAlO3 (012) subst rates using pulsed laser deposition (PLD). The full width at half maxi mum (FWHM) of the X-ray rocking curves for the (002) reflection of the Sr1-xBaxTiO3 were exceptionally narrow for films deposited on SrTiO3 (140 s of arc) and LaAlO3 (72 s of are) despite a lattice mismatch +/- 1% and 4% respectively. X-ray rocking curves for films deposited on Mg O substrates were significantly broader (+/-2500 arcsec). The data sho w that PLD can be used to grow films of MBE quality.