MICROANALYSIS SURFACE STUDIES AND PHOTOEMISSION PROPERTIES OF CSI PHOTOCATHODES

Citation
J. Almeida et al., MICROANALYSIS SURFACE STUDIES AND PHOTOEMISSION PROPERTIES OF CSI PHOTOCATHODES, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 367(1-3), 1995, pp. 337-341
Citations number
12
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
ISSN journal
01689002
Volume
367
Issue
1-3
Year of publication
1995
Pages
337 - 341
Database
ISI
SICI code
0168-9002(1995)367:1-3<337:MSSAPP>2.0.ZU;2-2
Abstract
We present recent results of the study of surface properties and quant um efficiency (QE) of CsI photocathodes prepared on various substrates . Microanalysis methods provide laterally resolved surface morphology and chemical composition of the photoemissive film. Integral measureme nts of the QE of CsI were done with a monochromator system and a RICH device. It was shown that CsI films deposited on large area Ni- or Ni- Au-coated printed circuit electrodes have a uniform crystalline struct ure and an average QE close to that reached on polished stainless stee l. The films have a good stability in air over periods of Ih. On a mic roscopic scale of 3-30 mu m, the films exhibit nonuniform emission pro perties correlated with variations in the chemical composition.