Jb. Lhoest et al., PMMA SURFACE MODIFICATION UNDER KEV AND MEV ION-BOMBARDMENT IN RELATION TO MAMMALIAN-CELL ADHESION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 105(1-4), 1995, pp. 322-327
Spin casted poly methyl methacrylate (PMMA) films were submitted to Ga
+ (15 keV), Xe+ (4 keV) and He+ (1 MeV) ion bombardments with fluences
varying between 10(+12) and 10(+16) ions/cm(2). The surface modificat
ions were studied by time-of-flight secondary ion mass spectrometry (T
oF-SIMS) and X-ray photoelectron spectroscopy (XPS). The evolution of
ToF-SIMS peaks characteristic of the polymer and of the degradation we
re followed as a function of the ion fluence. Surface deoxygenation an
d loss of the methacrylate pendent group were observed. These results
are discussed regarding the kind of energy deposition mode (electronic
and nuclear). The XPS results confirmed the surface deoxygenation. Fi
nally, the influence of the ion beam modifications on the adhesion of
mammalian cells were investigated. For this purpose, the samples were
reconditioned by a solution containing both a protein and a surfactant
prior to inoculation with human epithelial cells in a serum free nutr
itive medium. The results showed a preferential cell adhesion in the b
ombarded areas.