MICROWAVE COMPLEX FOR DETECTING DEFECTS IN RADIOTRANSPARENT MATERIALS

Authors
VERTII AA GUDYM IY IVANCHENKO IV KARELIN YV POPENKO NA
Citation
Aa. Vertii et al., MICROWAVE COMPLEX FOR DETECTING DEFECTS IN RADIOTRANSPARENT MATERIALS, Instruments and experimental techniques, 38(3), 1995, pp. 355-358
Citations number
3
Categorie Soggetti
Instument & Instrumentation",Engineering
Journal title
Instruments and experimental techniques → ACNP
ISSN journal
00204412
Volume
38
Issue
3
Year of publication
1995
Part
2
Pages
355 - 358
Database
ISI
SICI code
0020-4412(1995)38:3<355:MCFDDI>2.0.ZU;2-R
Abstract
A computerized complex for studying dielectric materials in the millim eter band is described. The test area of a sample is scanned under a n arrow probing beam. The technique reveals hidden defects with a space resolution lambda/2 root epsilon. Results of testing nonhomogeneous ce ramic samples at 130 GHz are presented.