While well-established methods for sample preparation and measurement
make ellipsometry attractive for surface and film investigations, deve
lopment of reliable methods for computing unknown physical attributes
of reflecting surfaces is just beginning, This situation has arisen be
cause the equations of ellipsometry are transcendental, have not been
inverted and thus require numerical techniques for solution in all but
the simplest of reflecting surface configurations. The problem of dat
a analysis is by no means solved and remains one of the key issues in
ellipsometry. This paper presents a survey of numerical techniques and
principles for approximating solutions to problems, and illustrates a
n application of these techniques in the development of a new algorith
m to address the problem.