K. Beardmore et R. Smith, C-60 FILM GROWTH AND THE INTERACTION OF FULLERENES WITH BARE AND H-TERMINATED SI SURFACES, STUDIED BY MOLECULAR-DYNAMICS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 106(1-4), 1995, pp. 74-79
The interaction of C-60 molecules with energies from 0.1-250 eV with S
i{100} surfaces is examined by molecular dynamics simulation. An empir
ical many-body potential function has been developed to describe inter
actions between C, Si and H atoms. This is used to compare C-60 intera
ctions with pure and hydrogen terminated Si surfaces. The simulations
of fullerene impact demonstrate the resilience of the C-60 cage. At en
ergies up to 250 eV the fullerene can bounce off the surface, but the
C-60-surface interaction is strongly affected by the angle of incidenc
e and the structure of the target surface. Energies greater than aroun
d 150 eV can cause damage to the fullerene and usually result in the m
olecule becoming bound to the surface. The growth of fullerene films f
rom low energy C-60 deposition on a Si surface is studied using a comb
ination of many-body and long-range potential functions. This enables
us to observe how the structural properties of the first layers change
during film growth. Movies of several simulations have been generated
to show details of typical interactions.