Jg. Marques et al., THE SUBSTITUTIONALITY OF HAFNIUM IN SAPPHIRE BY ION-IMPLANTATION AND LOW-TEMPERATURE ANNEALING, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 106(1-4), 1995, pp. 602-605
Hafnium was implanted into sapphire at room temperature to a dose of 5
x 10(14) atoms/cm(2). The lattice location of Hf was studied by RBS/c
hanneling and the recovery of isolated point defects was studied by hy
perfine interactions. It is shown that after implantation Hf is substi
tutional in the Al sites and the lattice recovery of the point defects
created during the implantation is achieved by furnace annealing at 3
50 and 550 degrees C.