M. Campos et al., PROPERTIES OF THE HETEROJUNCTION BETWEEN POLY(DITHIENOPYRROLE)-POLY(VINYLCHLORIDE) COMPOSITE AND N-DOPED SILICON, Synthetic metals, 75(1), 1995, pp. 61-64
Using the temperature dependence of the forward-biased current-voltage
characteristics as well as capacitance-voltage measurements, we calcu
lated the contact barrier height of the heterojunction between poly( d
ithienopyrrole) -poly(vinylchloride) composite and n-Si. Analysis of t
he characteristics suggests that thermionic emission over the composit
e/inorganic contact barrier dominates at low current densities, wherea
s at high current densities the process is dominated by the series res
istance. Very good reproducibility was observed for the junction chara
cteristics.