CHARACTERIZATION OF (PB,LA)TIO3 THIN-FILMS PREPARED BY SOL-GEL PROCESSING

(Pb,La)TiO3 (lead lanthanate titanate, PLT) ferroelectric thin films w ith a perovskite structure, whose composition agrees with stoichiometr y and whose distribution is homogeneous, have been prepared on various substrates by sol-gel processing. Epitaxial PLT thin films have been prepared on Pt him substrates. They are (111) PLT parallel to(111) Pt. The PLT thin films have good dielectric, ferroelectric, pyroelectric and optical properties. The dielectric constant and pyroelectric coeff icient of PL15 films on a Pt film are 210 and 5.25 X 10(-8) C cm(-2) K -1, respectively, at room temperature. The remanent polarization P-r a nd the coercive field E(c) of PL14 films on an Si wafer are 16.5 mu C cm(-2) and 60 kV cm(-1), respectively. The optical transmittance of PL 28 films deposited on quartz substrates is about 80% in the wavelength range 500-1000 nm.