WHITE-BEAM SYNCHROTRON TOPOGRAPHIC CHARACTERIZATION OF FLUX-GROWN KTIOASO4

Authors
LIU WJ JIANG SS HUANG XR HU XB GE CZ WANG JY JIANG JH WANG ZG
Citation
Wj. Liu et al., WHITE-BEAM SYNCHROTRON TOPOGRAPHIC CHARACTERIZATION OF FLUX-GROWN KTIOASO4, Applied physics letters, 68(1), 1996, pp. 25-27
Citations number
21
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
68
Issue
1
Year of publication
1996
Pages
25 - 27
Database
ISI
SICI code
0003-6951(1996)68:1<25:WSTCOF>2.0.ZU;2-D
Abstract
KTiOAsO4 crystals grown from tungstate fluxes have been studied by whi te-beam synchrotron radiation topography. It is shown that growth stri ations are primary planar defects. By anomalous scattering, ferroelect ric domains in KTA are investigated and the ratio of \F(004)\(2) to \F (00 $$(4) over bar)\(2) is calculated. The mechanisms of domain invers ion via 2-fold axis or n-glide plane are also discussed in terms of th e structural characteristics of KTA. (C) 1996 American Institute of Ph ysics.