Sa. Gurevich et al., REACTIVE ION ETCHED QUANTUM-WIRE STRUCTURES FOR LASER APPLICATIONS, Materials science & engineering. B, Solid-state materials for advanced technology, 35(1-3), 1995, pp. 47-50
This work presents the results of an investigation of the properties o
f high quality InGaAs-GaAs strained quantum well wire (QWW) structures
fabricated by means of the optimized reactive ion etching technique f
ollowed by special sample treatment and metallorganic chemical vapor d
eposition overgrowth. Both photoluminescence (PL) and electroluminesce
nce features were studied. The one-dimensional nature of electron-hole
gas in fabricated QWWs was proved by the observation of blue shift an
d polarization anisotropy of PL emission lines. High efficiency of QWW
luminescence was demonstrated by comparison of integrated PL intensit
y of QWWs with that of an unpatterned reference quantum well sample. T
he electro-optical properties of QWW laser structures was found to be
strongly dependent on the carrier capture process, which, in turn, is
determined to a great extent by the quality of the regrowth interface.