Hp. Yu et R. Murray, THE INFLUENCE OF EXCITON MIGRATION ON PHOTOLUMINESCENCE LIFETIME IN GROWTH-INTERRUPTED GAAS ALAS SINGLE QUANTUM-WELLS/, Materials science & engineering. B, Solid-state materials for advanced technology, 35(1-3), 1995, pp. 125-128
We have used resonant and non-resonant, low temperature, picosecond ti
me-resolved spectroscopy to investigate exciton migration in a GaAs/Al
As single quantum well grown by molecular beam expitaxy with growth in
terruption and post-growth hydrogen passivation. Excitons migrate with
a time constant around 1500 ps from the narrower to the wider well re
gions depopulating the narrower regions in favour of the wider regions
and this results in a faster decay time. This process is also demonst
rated by the photoluminescence spectrum with a large enhancement in th
e emission intensity of the wider regions when the narrower well regio
ns are resonantly excited.