APPLICATION OF A NEW ALGORITHM TO DEPTH PROFILING BY PIXE

Authors
Citation
P. Midy et I. Brissaud, APPLICATION OF A NEW ALGORITHM TO DEPTH PROFILING BY PIXE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 103(4), 1995, pp. 489-493
Citations number
12
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
103
Issue
4
Year of publication
1995
Pages
489 - 493
Database
ISI
SICI code
0168-583X(1995)103:4<489:AOANAT>2.0.ZU;2-6
Abstract
We propose a new method for concentration profile determination using the PIXE technique at different proton energies. The classical deconvo lution process involved is solved by a singular value decomposition of the ill-conditioned matrix obtained by discretization. The mathematic al tool is outlined. Different applications are shown and a comparison with other techniques is presented.