CHARACTERIZATION OF PB(ZR,TI)O-3 THIN-FILMS OBTAINED BY MOD

Pb(Zr,Ti)O-3 thin films were deposited by dip-coating on polycrystalli ne alumina substrates by using an MOD method. The thickness and homoge neity of the films were measured as a function of dip rates and soluti on concentration. Heating and cooling schedules determined the main st ructure of the crystallized films. Rheology measurements and Fourier t ransform-infrared spectra were carried out to obtain a better knowledg e of the solution features. A microstructural development study and so me ferroelectric measurements were also carried out.