PIEZOREFLECTANCE AND PHOTOREFLECTANCE STUDY OF GAAS ALGAAS DIGITAL ALLOY COMPOSITIONAL GRADED STRUCTURES/

Citation
Dy. Lin et al., PIEZOREFLECTANCE AND PHOTOREFLECTANCE STUDY OF GAAS ALGAAS DIGITAL ALLOY COMPOSITIONAL GRADED STRUCTURES/, Journal of applied physics, 79(1), 1996, pp. 460-466
Citations number
47
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
79
Issue
1
Year of publication
1996
Pages
460 - 466
Database
ISI
SICI code
0021-8979(1996)79:1<460:PAPSOG>2.0.ZU;2-N
Abstract
We have studied the piezoreflectance (PzR) spectra at 300 and 80 K rel ated to the intersubband transitions from two different (001) GaAs/AlG aAs structures, an asymmetric triangular quantum well and a rectangula r quantum well, fabricated by molecular beam epitaxy using the digital alloy compositional grading (DACG) method. A comparison of the relati ve intensity of heavy- and tight-hole related features in the PzR spec tra and those in the photoreflectance emphasizes the contribution of t he strain dependence of the energies of the confined states which allo ws us to identify the features associated with the heavy- and light-ho le valence bands unambiguously. Comparison of the observed intersubban d transitions with the envelope function calculations provides a self- consistent verification that the DACG method generated the desired pot ential profiles. Furthermore, the temperature dependence of both the e nergy position and broadening parameter of the fundamental conduction to heavy-hole (11H) and light-hole (11L) excitonic features are invest igated in the range of 20-300 K. The anomalous behavior of the tempera ture dependence of the linewidth of 11H(L) excitonic features of the s amples are discussed. (C) 1995 American Institute of Physics.