Heterojunction bipolar transistors (HBT's) with 2700 mu m(2) of emitte
r area are characterized for model verification using an active load-p
ull measurement system. The simulation and measurement results (up to
26 dBm) are reported and compared in terms of output power level and p
ower-added efficiency under variable operating conditions. These measu
rements are performed with the aim of designing power amplifiers for m
obile communications.