CHARACTERIZATION METHOD FOR IONIZING-RADIATION DEGRADATION IN POWER MOSFETS

Authors
DELABARDONNIE M MAOUAD A MIALHE P ELMAZRIA O HOFFMANN A LEPLEY B CHARLES JP
Citation
M. Delabardonnie et al., CHARACTERIZATION METHOD FOR IONIZING-RADIATION DEGRADATION IN POWER MOSFETS, IEEE transactions on nuclear science, 42(6), 1995, pp. 1622-1627
Citations number
13
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
Journal title
IEEE transactions on nuclear science → ACNP
ISSN journal
00189499
Volume
42
Issue
6
Year of publication
1995
Part
1
Pages
1622 - 1627
Database
ISI
SICI code
0018-9499(1995)42:6<1622:CMFIDI>2.0.ZU;2-P
Abstract
An innovative method for power MOSFETs characterization is presented. The radiation-induced degradation of structural parameters in the body -drain junction is shown to be related to the total dose. These result s provide a new way, through these new parameters, to qualify the radi ation response of power MOSFETs.