HIGH-ENERGY HEAVY-ION-INDUCED CHARGE-TRANSPORT ACROSS MULTIPLE JUNCTIONS

Citation
H. Dussault et al., HIGH-ENERGY HEAVY-ION-INDUCED CHARGE-TRANSPORT ACROSS MULTIPLE JUNCTIONS, IEEE transactions on nuclear science, 42(6), 1995, pp. 1780-1788
Citations number
10
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
ISSN journal
00189499
Volume
42
Issue
6
Year of publication
1995
Part
1
Pages
1780 - 1788
Database
ISI
SICI code
0018-9499(1995)42:6<1780:HHCAMJ>2.0.ZU;2-X
Abstract
High-energy heavy ion experiments and numerical simulations show that two or more junctions bridged by an ion track respond in a coupled man ner. The potential difference across the structure strongly affects th e amount of charge collected at each of the junctions. Experiments wit h 1.7 GeV Au-197 ions indicate that, for emitter biases less than or e qual to 0.0 volts and potential differences of 5 or more volts, more c harge may be collected at a junction than was initially deposited by t he ion. Simulations show that, when an ion track intersects multiple j unctions of a device, the responses of the individual junctions cannot be modeled independently of each other. Simulation and experimental r esults indicate that charge transport in a multiple junction structure cannot be modeled using simple geometry or funneling assumptions.