H. Dussault et al., HIGH-ENERGY HEAVY-ION-INDUCED CHARGE-TRANSPORT ACROSS MULTIPLE JUNCTIONS, IEEE transactions on nuclear science, 42(6), 1995, pp. 1780-1788
High-energy heavy ion experiments and numerical simulations show that
two or more junctions bridged by an ion track respond in a coupled man
ner. The potential difference across the structure strongly affects th
e amount of charge collected at each of the junctions. Experiments wit
h 1.7 GeV Au-197 ions indicate that, for emitter biases less than or e
qual to 0.0 volts and potential differences of 5 or more volts, more c
harge may be collected at a junction than was initially deposited by t
he ion. Simulations show that, when an ion track intersects multiple j
unctions of a device, the responses of the individual junctions cannot
be modeled independently of each other. Simulation and experimental r
esults indicate that charge transport in a multiple junction structure
cannot be modeled using simple geometry or funneling assumptions.