HIGH-ENERGY HEAVY-ION-INDUCED CHARGE-TRANSPORT ACROSS MULTIPLE JUNCTIONS

High-energy heavy ion experiments and numerical simulations show that two or more junctions bridged by an ion track respond in a coupled man ner. The potential difference across the structure strongly affects th e amount of charge collected at each of the junctions. Experiments wit h 1.7 GeV Au-197 ions indicate that, for emitter biases less than or e qual to 0.0 volts and potential differences of 5 or more volts, more c harge may be collected at a junction than was initially deposited by t he ion. Simulations show that, when an ion track intersects multiple j unctions of a device, the responses of the individual junctions cannot be modeled independently of each other. Simulation and experimental r esults indicate that charge transport in a multiple junction structure cannot be modeled using simple geometry or funneling assumptions.