SEE RESULTS USING HIGH-ENERGY IONS

Authors
DUZELLIER S FALGUERE D MOULIERE L ECOFFET R BUISSON J
Citation
S. Duzellier et al., SEE RESULTS USING HIGH-ENERGY IONS, IEEE transactions on nuclear science, 42(6), 1995, pp. 1797-1802
Citations number
11
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
Journal title
IEEE transactions on nuclear science → ACNP
ISSN journal
00189499
Volume
42
Issue
6
Year of publication
1995
Part
1
Pages
1797 - 1802
Database
ISI
SICI code
0018-9499(1995)42:6<1797:SRUHI>2.0.ZU;2-J
Abstract
SEE data on SRAMs and DRAMs, obtained with low and high energy ions, a re presented. The global response of these devices remained coherent u sing low or high energy beams (angle effects, pattern influences, mult iple-bit error proportion...), but, discrepancies appeared, in some ca ses, in the threshold part of the sensitivity curves. These anomalies seem in relation with a track structure.