SINGLE EVENT UPSET RATES ON 1 MBIT AND 256 KBIT MEMORIES - CRUX EXPERIMENT ON APEX

Authors
ADOLPHSEN J BARTH JL STASSINOPOULOS EG GRUNER T WENNERSTEN M LABEL KA SEIDLECK CM
Citation
J. Adolphsen et al., SINGLE EVENT UPSET RATES ON 1 MBIT AND 256 KBIT MEMORIES - CRUX EXPERIMENT ON APEX, IEEE transactions on nuclear science, 42(6), 1995, pp. 1964-1974
Citations number
28
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
Journal title
IEEE transactions on nuclear science → ACNP
ISSN journal
00189499
Volume
42
Issue
6
Year of publication
1995
Part
1
Pages
1964 - 1974
Database
ISI
SICI code
0018-9499(1995)42:6<1964:SEURO1>2.0.ZU;2-E
Abstract
This paper presents the results from the CRUX experiment on the Air Fo rce APEX satellite. The experiment monitors single event upsets on scr eened commercial 256 Kbit and 1 Mbit SRAMs. It is shown that trapped p rotons dominate the single event upset rates, as evidenced by correlat ion with measured proton flux peaks and with flux contours calculated with the AP8 model. Pitfalls of using generic ground test data are mad e clearly evident.