FURTHER DEVELOPMENT OF THE HEAVY-ION CROSS-SECTION FOR SINGLE EVENT UPSET - MODEL (HICUP)

HICUP models the angular dependent heavy ion upset cross section. It p ulls together many of the parameters and concepts used to characterize the Single Event Upset (SEU) phenomena, unifying them in a single coh esive model. HICUP is based on Rectangular Parallelepiped (RPP) geomet ry for the sensitive volume and the Weibull density function for the u pset threshold energy. Excellent agreement is obtained between the mod el and heavy ion test data. HICUP is used to derive the correct scalin g laws for transforming angular cross section data to normal incidence , reconciling two previously proposed inverse cosine scaling correctio ns. The angle-integrated HICUP model, I-HICUP, is used in Galactic Cos mic Ray (GCR) upset rate calculations with results nearly identical to the Space Radiation(TM) code. Letaw [12] has procuced an automated SE U parameter fitting routine based on HICUP and the chi(2) method. It f errets out the best-fit critical SEU parameters embedded within the ra w angular test data, including charge collection depth and funnel leng th. His method couples directly to the upset rate calculation in a sel f-consistent manner eliminating the need to arbitrarily assume a devic e depth. Results of this new procedure are presented.