IMAGING OF CYTOSKELETAL ELEMENTS BY LOW-TEMPERATURE HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPY (VOL 179, PG 67, 1995)

Citation
Y. Chen et al., IMAGING OF CYTOSKELETAL ELEMENTS BY LOW-TEMPERATURE HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPY (VOL 179, PG 67, 1995), Journal of Microscopy, 180, 1995, pp. 327-327
Citations number
1
Categorie Soggetti
Microscopy
Journal title
ISSN journal
00222720
Volume
180
Year of publication
1995
Part
3
Pages
327 - 327
Database
ISI
SICI code
0022-2720(1995)180:<327:IOCEBL>2.0.ZU;2-Z