OPTICAL CHARACTERIZATION OF AMORPHOUS AND POLYCRYSTALLINE SILICON FILMS

Authors
IBOK E GARG S LI GG FOROUHI AR BLOOMER I AGER J
Citation
E. Ibok et al., OPTICAL CHARACTERIZATION OF AMORPHOUS AND POLYCRYSTALLINE SILICON FILMS, Solid state technology, 1995, pp. 11
Citations number
6
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
Solid state technology → ACNP
ISSN journal
0038111X
Year of publication
1995
Supplement
S
Database
ISI
SICI code
0038-111X(1995):<11:OCOAAP>2.0.ZU;2-0