FOCUSED ION-BEAM LITHOGRAPHY OF MULTIPERIOD GRATINGS FOR A WAVELENGTH-DIVISION-MULTIPLEXED TRANSMITTER LASER ARRAY

Citation
Im. Templeton et al., FOCUSED ION-BEAM LITHOGRAPHY OF MULTIPERIOD GRATINGS FOR A WAVELENGTH-DIVISION-MULTIPLEXED TRANSMITTER LASER ARRAY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(6), 1995, pp. 2722-2724
Citations number
9
Categorie Soggetti
Physics, Applied
ISSN journal
10711023
Volume
13
Issue
6
Year of publication
1995
Pages
2722 - 2724
Database
ISI
SICI code
1071-1023(1995)13:6<2722:FILOMG>2.0.ZU;2-Y
Abstract
Wavelength-division multiplexing with closely spaced multiple waveleng ths is of great interest for high-capacity data transmission. One majo r acid very critical requirement of such a system is the fabrication o f a laser array with very small wavelength separations (similar to 2 n m). In this paper, the design, fabrication, and performance of an inte grated eight-channel system is described. Focused ion beam lithography , with the beam deflection sensitivity modified from its calibrated va lue, is used to write the critical stepped-period distributed-Bragg-re flector gratings required to provide the tightly controlled multiple l aser frequencies. The outputs of the lasers are combined via curved wa veguides into a single optical output.