AUGER EMISSION FROM XE ABOVE AND BELOW THE 4D IONIZATION THRESHOLD

The Auger electron yield from xenon has been measured in the vicinity of the 4d inner-shell ionization threshold. Just above this ionization threshold the Auger line profile is modified by the post-collision in teraction effect involving a slow photoelectron. The process is follow ed through threshold into a region where the photoelectron is recaptur ed and either shaken up/down or remains in its Rydberg orbital during the Auger decay. By measuring the electron yield as a function of both incident photon energy and electron kinetic energy a comprehensive st udy of these processes is made.