THE ELECTRICAL-RESISTANCE VERSUS TEMPERATURE-DEPENDENCE OF SINGLE AMORPHOUS CRNI (40 60) THIN-FILMS RF-SPUTTERED IN HIGH ARGON PRESSURE/

Citation
Mi. Birjega et al., THE ELECTRICAL-RESISTANCE VERSUS TEMPERATURE-DEPENDENCE OF SINGLE AMORPHOUS CRNI (40 60) THIN-FILMS RF-SPUTTERED IN HIGH ARGON PRESSURE/, Journal of materials science letters, 15(1), 1996, pp. 77-79
Citations number
32
Categorie Soggetti
Material Science
ISSN journal
02618028
Volume
15
Issue
1
Year of publication
1996
Pages
77 - 79
Database
ISI
SICI code
0261-8028(1996)15:1<77:TEVTOS>2.0.ZU;2-Q