X-RAY-SCATTERING TOPOGRAPHY INVOLVING LOCAL SPECTROSCOPY

X-ray scattering topography using multichannel detectors as a position sensitive detector and an energy dispersive solid state detector is d escribed. The system involves measuring the x-ray spectrum at each loc al place. The new topography system adds another dimension to x-ray sc attering topography proposed by the present authors over the past ten years. It produces topographs constructed with certain physical quanti ties, such as crystal orientation, as well as an ordinary integrated i ntensity map. Included in the paper is the orientation topography for an Fe-3%Si alloy single crystal, structural observation of an Al-4%Cu alloy polycrystal having a welded region, and the non-destructive test ing of an amorphous rubber tyre. Emphasis is placed on the first propo sal of x-ray spectroscopy topography.