X-ray scattering topography using multichannel detectors as a position
sensitive detector and an energy dispersive solid state detector is d
escribed. The system involves measuring the x-ray spectrum at each loc
al place. The new topography system adds another dimension to x-ray sc
attering topography proposed by the present authors over the past ten
years. It produces topographs constructed with certain physical quanti
ties, such as crystal orientation, as well as an ordinary integrated i
ntensity map. Included in the paper is the orientation topography for
an Fe-3%Si alloy single crystal, structural observation of an Al-4%Cu
alloy polycrystal having a welded region, and the non-destructive test
ing of an amorphous rubber tyre. Emphasis is placed on the first propo
sal of x-ray spectroscopy topography.