H. Farhang et al., ELECTRON BACKSCATTERING AND SECONDARY-ELECTRON EMISSION FROM CARBON TARGETS - COMPARISON OF EXPERIMENTAL RESULTS WITH MONTE-CARLO SIMULATIONS, Journal of physics. D, Applied physics, 26(12), 1993, pp. 2266-2271
Electron backscattering (EBS) and secondary electron emission (SEE) yi
eld have been measured for bulk carbon with a density of 1.8 g cm-3, f
or primary electron energies in the range from 100 to 500 eV and from
12 to 1 000 eV respectively. The backscattering results were in agreem
ent with an empirical formula to within 2%. The SEE yield value was 0.
04 at lowest measured energy (12 eV) and reached a maximum value of 0.
54 at about 300 eV. The backscattering coefficients and SEE yield have
also been calculated using a Monte Carlo simulation for the energy ra
nge from 12 to 1000 eV. In the simulation, two different energy loss c
haracteristics were used. The first was obtained from a set of optical
data and gave good agreement with the experimental SEE yield but poor
agreement with the backscattering data. The second was obtained from
a modified Bethe energy loss function which fitted the backscattering
data well. Using the Bethe loss function for each primary electron, th
e SEE yield was calculated for every path length between scattering ev
ents by dividing the primary electron energy lost per unit path length
by the average energy required to create a secondary electron. The SE
E data was fitted on the assumption that the average energy to create
a secondary varied with primary electron energy according to a four pa
rameter function. Comparison of the calculated SEE yield with the expe
rimental SEE yield, as a function of incident angle of the primary bea
m, was good over the energy range from 100 to 500 eV.