APPLIED-VOLTAGE INDUCED FATIGUE OF LITHIUM-NIOBATE WAVE-GUIDE

z-cut lithium niobate optical modulator devices were ac (V-p-p = 20 V) operated at 130 degrees C with an accumulated de bias voltage of 4 an d 8 V. A consequent de drift phenomenon was larger for the 8 V bias ap plication. After the operation, inversed domains were found along the Mach-Zehnder waveguides, particularly on the waveguide placed under th e hot electrode. The results suggested that the device operation at hi gher voltage and temperature led to an accelerated de drift and a fati guelike deterioration of the lithium niobate material. (C) 1996 Americ an Institute of Physics.