XPS STUDIES FOR AN IRON-ZIRCONIUM INTERFACE IN AN OXIDIZING ENVIRONMENT

Citation
Ys. Li et al., XPS STUDIES FOR AN IRON-ZIRCONIUM INTERFACE IN AN OXIDIZING ENVIRONMENT, Surface review and letters, 2(6), 1995, pp. 759-763
Citations number
11
Categorie Soggetti
Physics, Condensed Matter","Physics, Atomic, Molecular & Chemical","Material Science
Journal title
ISSN journal
0218625X
Volume
2
Issue
6
Year of publication
1995
Pages
759 - 763
Database
ISI
SICI code
0218-625X(1995)2:6<759:XSFAII>2.0.ZU;2-S
Abstract
A bimetallic film of iron and zirconium (thicknesses about 17 and 52 A ngstrom respectively) was deposited on a gold substrate and studied by XPS after exposing to O-2 (approximately 10(3) L) at room temperature , and then heating at progressively higher temperatures up to 400 degr ees C. An iron-oxide/iron/zirconium-oxide sandwich structure is presen t after the room-temperature exposure to O-2, and this work shows the ready transfer of O from the iron side to the zirconium side of the Fe /Zr interface. Fe migration also occurs at 220 degrees C and above, wh ile by 300 degrees C this diffusion appears to cause a substantial res tructuring of the ZrO2 layer.