QUALITATIVE AND QUANTITATIVE SURFACE-ANALYSIS VIA X-RAY PHOTOEMISSIONAND AUGER-ELECTRON SPECTROSCOPIES

Authors
Citation
M. Sancrotti, QUALITATIVE AND QUANTITATIVE SURFACE-ANALYSIS VIA X-RAY PHOTOEMISSIONAND AUGER-ELECTRON SPECTROSCOPIES, Surface review and letters, 2(6), 1995, pp. 859-883
Citations number
38
Categorie Soggetti
Physics, Condensed Matter","Physics, Atomic, Molecular & Chemical","Material Science
Journal title
ISSN journal
0218625X
Volume
2
Issue
6
Year of publication
1995
Pages
859 - 883
Database
ISI
SICI code
0218-625X(1995)2:6<859:QAQSVX>2.0.ZU;2-2