STUDY OF THE MICROSTRUCTURE OF YBA2CU3O7- X FILMS WITH DIFFERENT UHF SURFACE-RESISTANCE BY THE X-RAY-DIFFRACTOMETRY TECHNIQUE IN PLANES NON-PERPENDICULAR AXIS-C

Authors
VENDIK OG GOLMAN EK ZAITSEV AG PETROV PK RAZUMOV SV
Citation
Og. Vendik et al., STUDY OF THE MICROSTRUCTURE OF YBA2CU3O7- X FILMS WITH DIFFERENT UHF SURFACE-RESISTANCE BY THE X-RAY-DIFFRACTOMETRY TECHNIQUE IN PLANES NON-PERPENDICULAR AXIS-C, Pis'ma v Zurnal tehniceskoj fiziki, 21(6), 1995, pp. 41-45
Citations number
6
Categorie Soggetti
Physics, Applied
Journal title
Pis'ma v Zurnal tehniceskoj fiziki → ACNP
ISSN journal
03200116
Volume
21
Issue
6
Year of publication
1995
Pages
41 - 45
Database
ISI
SICI code
0320-0116(1995)21:6<41:SOTMOY>2.0.ZU;2-1