Js. Jeon et al., EFFECT OF TEMPERATURE ON THE INTERACTION OF SILICON WITH NONIONIC SURFACTANTS IN ALKALINE-SOLUTIONS, Journal of the Electrochemical Society, 143(1), 1996, pp. 277-283
The interaction of silicon wafers with alkaline solutions of octylphen
ol polyethylene oxide nonionic surfactants of different ethylene oxide
chain length has been characterized at 25, 50, and 75 degrees C. Wett
ability of silicon wafers was improved significantly at higher tempera
tures. Surfactants with long ethylene oxide chains exhibited less adso
rption than surfactants with short ethylene oxide chains, and increase
in solution temperature resulted in increased adsorption. Generally,
the addition of surfactants to alkaline solution decreased the surface
roughness of silicon; however, the degree of reduction of surface rou
ghness was influenced by the length of ethylene oxide chain and condit
ioning temperature.