High-frequency experiments depend sensitively on homogeneous and inhom
ogeneous ''defects'' in the normal and superconducting state. As homog
eneous effects, the intrinsic scattering time is of great theoretical
importance above 0.1 THz in the surface impedance Z. Of practical impo
rtance are the planar defects, ''the weak links (WL),'' which interrup
t the rf shielding currents and thus enhance Z(eff). In the supercondu
cting state, the Josephson current j(cJ) crosses the WL in parallel wi
th the normal, leakage current j(bl). The latter explains the observed
, finite rf residual losses R(res)(T approximate to 0) quantitatively
and as a function of material parameters, temperature T, field H, and
frequency omega for Nb, NbN, and cuprate superconductors. With increas
ing field, Z deteriorates like H-2 up to H-clJ, where Josephson fluxon
s (JF) penetrate into the WL yielding delta Z proportional to H. Above
H-clJ approximate to 0.1-10 mT, JF dynamics dominates Z with hysteres
is losses and reactive components. The nonlinear JF effects are enforc
ed by thin-film edge enhancements limiting the performance of various
devices by enhanced dissipation, reactance, and flux noise. A method i
s presented which is able to separate electron dynamics at the WL from
their strength and distribution.