QUANTITATIVE-DETERMINATION OF LOW PHASE VOLUME FRACTION IN FERROSILICON ALLOYS BY THE RIETVELD PROFILE-REFINEMENT METHOD - NEUTRON-DIFFRACTION DATA COMPARED WITH OTHER METHODS
C. Gueneau et C. Servant, QUANTITATIVE-DETERMINATION OF LOW PHASE VOLUME FRACTION IN FERROSILICON ALLOYS BY THE RIETVELD PROFILE-REFINEMENT METHOD - NEUTRON-DIFFRACTION DATA COMPARED WITH OTHER METHODS, Journal of applied crystallography, 28, 1995, pp. 707-716
Neutron diffraction data collected from ferrosilicon alloy powders hav
e been analysed using the Rietveld profile-refinement method in order
to perform a quantitative determination of the phase volume fraction.
The results obtained have been compared with those determined from oth
er methods such as imaging analysis, chemical analysis and phase-diagr
am calculation by a thermodynamic approach. For low phase volume fract
ions, the Rietveld profile refinement of the neutron-powder-diffractom
eter data gives results that are more accurate than those from imaging
analysis and that are more representative at the ingot scale than tho
se from chemical analysis, owing to the greater quantity of powder ana
lysed. As concerns the thermodynamic calculations, two phase volume fr
action determinations may be performed: quantitative, at equilibrium,
and qualitative, out of equilibrium.