IMPACT OF MICROSTRUCTURE ON STABILITY OF PERMANENT-MAGNET BIASED MAGNETORESISTIVE HEADS

Authors
ZHU JG OCONNOR DJ
Citation
Jg. Zhu et Dj. Oconnor, IMPACT OF MICROSTRUCTURE ON STABILITY OF PERMANENT-MAGNET BIASED MAGNETORESISTIVE HEADS, IEEE transactions on magnetics, 32(1), 1996, pp. 54-60
Citations number
8
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
Journal title
IEEE transactions on magnetics → ACNP
ISSN journal
00189464
Volume
32
Issue
1
Year of publication
1996
Pages
54 - 60
Database
ISI
SICI code
0018-9464(1996)32:1<54:IOMOSO>2.0.ZU;2-N
Abstract
This work pertains to output voltage stability of soft adjacent layer biased magnetoresistive heads with abutted permanent magnetic films fo r domain stabilization. A micromagnetic model has been developed to st udy the effect of the permanent magnet film microstructure and the mic romagnetic properties of the abutted junction interface on head stabil ity. The impact on head stability is analyzed with respect to interfac ial ferromagnetic coupling across the junction interface and intergran ular exchange coupling in the permanent magnet films among other film properties.