We analyse, for the first time, the effect of bond angle disorder on t
he dielectric constant epsilon(0) of a model amorphous III-V compound
semiconductor. We adopt a linear combination of hybrids method develop
ed by us. We introduce distortion in bond angles and construct an orth
onormal basis set for the disorder network to obtain an expression for
epsilon(0)(Delta) in terms of bond-angle distortion parameter Delta.
We analyse epsilon(0)(Delta) with increasing Delta. Our results agree
well with experiment.