RESONANT-TUNNELING PROPERTIES OF SINGLE-ELECTRON TRANSISTORS WITH A NOVEL DOUBLE-GATE GEOMETRY

Citation
T. Fujisawa et S. Tarucha, RESONANT-TUNNELING PROPERTIES OF SINGLE-ELECTRON TRANSISTORS WITH A NOVEL DOUBLE-GATE GEOMETRY, Applied physics letters, 68(4), 1996, pp. 526-528
Citations number
8
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
68
Issue
4
Year of publication
1996
Pages
526 - 528
Database
ISI
SICI code
0003-6951(1996)68:4<526:RPOSTW>2.0.ZU;2-K
Abstract
We describe the operation of single electron transistors with a double -gate geometry defined by Ga focused ion beam implanted in-plane gates and line Schottky gates. The in-plane gates are used to squeeze the c hannel and to increase the charging energy. The Schottky gates are pla ced on the channel to form the tunnel junctions. lndependent control o f these gates is useful to define the geometry of single electron tran sistors. We found strong resonances exhibiting negative differential r esistance in the small devices, which is attributed to tunneling throu gh zero-dimensional states when the barrier has a parabolic-shaped pot ential. (C) 1996 American Institute of Physics.