T. Fujisawa et S. Tarucha, RESONANT-TUNNELING PROPERTIES OF SINGLE-ELECTRON TRANSISTORS WITH A NOVEL DOUBLE-GATE GEOMETRY, Applied physics letters, 68(4), 1996, pp. 526-528
We describe the operation of single electron transistors with a double
-gate geometry defined by Ga focused ion beam implanted in-plane gates
and line Schottky gates. The in-plane gates are used to squeeze the c
hannel and to increase the charging energy. The Schottky gates are pla
ced on the channel to form the tunnel junctions. lndependent control o
f these gates is useful to define the geometry of single electron tran
sistors. We found strong resonances exhibiting negative differential r
esistance in the small devices, which is attributed to tunneling throu
gh zero-dimensional states when the barrier has a parabolic-shaped pot
ential. (C) 1996 American Institute of Physics.