Hn. Alshareef et al., EFFECT OF B-SITE CATION STOICHIOMETRY ON ELECTRICAL FATIGUE OF RUO2 PB(ZRXTI1-X)O-3/RUO2 CAPACITORS/, Journal of applied physics, 79(2), 1996, pp. 1013-1016
There have been numerous reports that Pb(ZrxTi1-x)O-3 (PZT) thin-film
capacitors with RuO2 electrodes and compositions near the morphotropic
phase boundary exhibit minimal decrease in switched polarization with
electric-field cycling. We show thar. the fatigue performance of RuO2
//PZT//RuO2 capacitors strongly depends on PZT film composition. Speci
fically, we demonstrate that the rate of polarization fatigue increase
s with increasing Ti content for PZT thin films of tetragonal crystal
symmetry deposited on RuO2 electrodes. As the Ti content of the PZT fi
lms increased, the film gain morphology changed from columnar to granu
lar and the volume percent of a fluorite-type second phase decreased.
These microstructural trends and the possibility that the electrode ma
terial acts as a sink for oxygen vacancies are discussed to explain th
e fatigue dependence on B-site cation ratio for PZT films with RuO2 el
ectrodes. (C) 1996 American institute of Physics.