Ao. Marcano et al., PICOSECOND NONLINEAR REFRACTION MEASUREMENT IN SINGLE-BEAM OPEN Z-SCAN BY CHARGE-COUPLED-DEVICE IMAGE-PROCESSING, Optics letters, 21(2), 1996, pp. 101-103
We propose a picosecond single-beam open Z-scan experiment in which th
e usual apertured detection scheme is replaced by a two-dimensional si
ngle-shot CCD camera. This enables us to extract the two-dimensional t
ransverse modifications of the whole far-field pattern that are due to
nonlinear refraction as well as to measure the induced nonlinear phas
e shift with increased sensitivity compared with that of the conventio
nal Z scan. (C) 1996 Optical Society of America