PICOSECOND NONLINEAR REFRACTION MEASUREMENT IN SINGLE-BEAM OPEN Z-SCAN BY CHARGE-COUPLED-DEVICE IMAGE-PROCESSING

Authors
MARCANO AO MAILLOTTE H GINDRE D METIN D
Citation
Ao. Marcano et al., PICOSECOND NONLINEAR REFRACTION MEASUREMENT IN SINGLE-BEAM OPEN Z-SCAN BY CHARGE-COUPLED-DEVICE IMAGE-PROCESSING, Optics letters, 21(2), 1996, pp. 101-103
Citations number
7
Categorie Soggetti
Optics
Journal title
Optics letters → ACNP
ISSN journal
01469592
Volume
21
Issue
2
Year of publication
1996
Pages
101 - 103
Database
ISI
SICI code
0146-9592(1996)21:2<101:PNRMIS>2.0.ZU;2-V
Abstract
We propose a picosecond single-beam open Z-scan experiment in which th e usual apertured detection scheme is replaced by a two-dimensional si ngle-shot CCD camera. This enables us to extract the two-dimensional t ransverse modifications of the whole far-field pattern that are due to nonlinear refraction as well as to measure the induced nonlinear phas e shift with increased sensitivity compared with that of the conventio nal Z scan. (C) 1996 Optical Society of America