EFFECTS OF LATENT TRACKS FORMED BY HIGH-ENERGY ION-IMPLANTATION IN CRYSTALS

Authors
Citation
Ff. Komarov, EFFECTS OF LATENT TRACKS FORMED BY HIGH-ENERGY ION-IMPLANTATION IN CRYSTALS, Langmuir, 12(1), 1996, pp. 199-206
Citations number
51
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
07437463
Volume
12
Issue
1
Year of publication
1996
Pages
199 - 206
Database
ISI
SICI code
0743-7463(1996)12:1<199:EOLTFB>2.0.ZU;2-F
Abstract
The influence of various effects inherent to the high-energy ion bomba rdment of crystals on the latent track. formation is treated. The natu re of tracks is dependent on a type of solids. The relaxation of stron g electron excitation which occurs under irradiation of materials by e nergetic ions is the main parameter which defines the nature of track regions. The track migration of implanted atoms as well as track chann eling of incident ions is discussed for ion implantation in semiconduc tors.