A quasi-steady state approximation is used to derive expressions for t
he waveforms of minority carrier charge stored in p(+)nn(+) power junc
tion diodes driven by large-signal sinusoidal and ramp voltages. These
waveforms are derived by solving a diode charge-control differential
equation. Using the charge waveforms, the storage time is determined a
nd the diode current and voltage waveforms are predicted. It is shown
that three frequency ranges can be distinguished: (1) low-frequency ra
nge in which the reverse recovery is negligible, (2) mid-frequency ran
ge in which the reverse recovery is detrimental, but the diode is stil
l of practical value, and (3) high-frequency range where the diode doe
s not exhibit its rectifying properties. A simple method for measuring
the minority carrier lifetime is proposed. Experimental results are g
iven for an MR826 East-recovery pn junction diode and a 31DQ06 Schottk
y diode for operating frequencies of up to 10 MHz. The theoretical and
experimental results were in good agreement.