EVANESCENT INTERFEROMETRY BY SCANNING OPTICAL TUNNELING DETECTION

Authors
BAINIER C COURJON D BAIDA F GIRARD C
Citation
C. Bainier et al., EVANESCENT INTERFEROMETRY BY SCANNING OPTICAL TUNNELING DETECTION, Journal of the Optical Society of America. A, Optics, image science,and vision., 13(2), 1996, pp. 267-275
Citations number
21
Categorie Soggetti
Optics
Journal title
Journal of the Optical Society of America. A, Optics, image science,and vision. → ACNP
ISSN journal
10847529
Volume
13
Issue
2
Year of publication
1996
Pages
267 - 275
Database
ISI
SICI code
1084-7529(1996)13:2<267:EIBSOT>2.0.ZU;2-9
Abstract
The work reported deals with evanescent-wave interferometry. In a scan ning tunneling optical microscope (STOM/PSTM) we study the interaction of an evanescent standing wave with nanometer-sized objects. Two comp lementary numerical models are compared with experimental results. Fin ally, it is shown that synthetic interferograms can be generated by us e of the distinctive features of this kind of microscope. (C) 1996 Opt ical Society of America