Bm. Law et Hk. Pak, ELLIPSOMETRIC IMAGING OF SURFACE DROPS, Journal of the Optical Society of America. A, Optics, image science,and vision., 13(2), 1996, pp. 379-384
We quantify the behavior of the real (R) and imaginary (I) components
of the optical response of a recently developed ellipsometric microsco
pe. For a polydimethylsiloxane drop spreading on top of a silicon wafe
r substrate the experimental values of R and I show the same correlati
on as a function of film thickness as do the theoretical values. This
confirms that the ellipsometric microscope is operating as predicted.
The ellipsometric microscope has a thickness resolution of similar to
0.1 nm and a lateral spatial resolution of similar to 1 mu m and can c
ollect 512 x 512 pixels of information in approximately 20s. (C) 1996
Optical Society of America