DEGRADATION OF SI-SIO2 INTERPHASE BOUNDAR Y DUE TO FIELD AND RADIATION EFFECTS

Citation
Iv. Klimov et al., DEGRADATION OF SI-SIO2 INTERPHASE BOUNDAR Y DUE TO FIELD AND RADIATION EFFECTS, Pis'ma v Zurnal tehniceskoj fiziki, 21(10), 1995, pp. 1-5
Citations number
5
Categorie Soggetti
Physics, Applied
ISSN journal
03200116
Volume
21
Issue
10
Year of publication
1995
Pages
1 - 5
Database
ISI
SICI code
0320-0116(1995)21:10<1:DOSIBY>2.0.ZU;2-Y