PICOSECOND 4-WAVE-MIXING IN GAN EPILAYERS AT 532 NM

Citation
B. Taheri et al., PICOSECOND 4-WAVE-MIXING IN GAN EPILAYERS AT 532 NM, Applied physics letters, 68(5), 1996, pp. 587-589
Citations number
21
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
68
Issue
5
Year of publication
1996
Pages
587 - 589
Database
ISI
SICI code
0003-6951(1996)68:5<587:P4IGEA>2.0.ZU;2-3
Abstract
Pulsed probe degenerate four wave mixing experiments were performed on GaN epilayers using 13 ps pulses at 532 nm. Intensity and time respon se of the scattering efficiency was studied. Intensity dependence of t he observed signal suggests carrier generation by both single and two photon effects. The absolute scattering efficiency was measured and re lated to pump-induced nonlinear index change. The nonlinear refractive coefficient found was 1 x 10(-3) cm(2)/GW which is greater than an or der of magnitude larger than the expected value. Time response of the signal was found to be dictated by carrier lifetimes. Double-exponenti al decays to trap levels with lifetimes of 100 ps and 1.1 ns are sugge sted as the dominant recombination processes. (C) 1996 American Instit ute of Physics.