HYDROGEN INTERACTION WITH SHALLOW AND DEEP CENTERS IN GAAS

Citation
Aa. Bonapasta et L. Pavesi, HYDROGEN INTERACTION WITH SHALLOW AND DEEP CENTERS IN GAAS, International journal of quantum chemistry, 57(5), 1996, pp. 823-841
Citations number
44
Categorie Soggetti
Chemistry Physical
ISSN journal
00207608
Volume
57
Issue
5
Year of publication
1996
Pages
823 - 841
Database
ISI
SICI code
0020-7608(1996)57:5<823:HIWSAD>2.0.ZU;2-Q
Abstract
The results of detailed theoretical investigations of the properties o f atomic and diatomic H in GaAs were analyzed with the effort to give a unified picture of the H behavior in this semiconductor. All calcula tions were performed in the pseudopotential density-functional framewo rk using a supercell approach. We studied both shallow impurities (Si and C) and deep point defects (As antisite and Ga vacancy). Generally, a simple scheme may be applied in order to describe the H interaction with shallow impurities, where a key role is played by the amphoteric character of H. More complex mechanisms are involved in the deep impu rity case that are related to new, interesting effects of H incorporat ion in GaAs. (C) 1996 John Wiley & Sons, Inc.