METAMORPHIC INALAS INGAAS HEMTS ON GAAS SUBSTRATES WITH COMPOSITE CHANNELS AND 350-GHZ F(MAX) WITH 160-GHZ F(T)/

Citation
M. Chertouk et al., METAMORPHIC INALAS INGAAS HEMTS ON GAAS SUBSTRATES WITH COMPOSITE CHANNELS AND 350-GHZ F(MAX) WITH 160-GHZ F(T)/, Microwave and optical technology letters, 11(3), 1996, pp. 145-147
Citations number
6
Categorie Soggetti
Optics,"Engineering, Eletrical & Electronic
ISSN journal
08952477
Volume
11
Issue
3
Year of publication
1996
Pages
145 - 147
Database
ISI
SICI code
0895-2477(1996)11:3<145:MIIHOG>2.0.ZU;2-F
Abstract
We report on fabrication and performance of novel 0.13-mu m T-gate met amorphic InAlAs/lnGaAs HEMTs on GaRs substrates with composite InGaAs channels, combining the superior transport properties of In0.52Ga0.48A s with low-impact ionization in the In0.32Ga0.68As subchannel. These d evices exhibit excellent de characteristics, high drain currents of 75 0 mA/mm, extrinsic transconductances of 600 mS/mm combined with very l ow output conductance values of 20 mS/mm, and high channel and gate br eakdown voltages. The use of a composite InGaAs channel leads to excel lent cutoff frequencies: a maximum frequency of oscillation f(max) of 350 GHz and a current gain cutoff frequency of 160 GHz. These are the best microwave frequency results ever reported for any FET on GaAs sub strate. (C) 1996 John Wiley & Sons, Inc.