SCANNING-TUNNELING-MICROSCOPY WITH ATOMIC-RESOLUTION ON RES2 SINGLE-CRYSTALS GROWN BY VAPOR-PHASE TRANSPORT - REPLY

Citation
K. Friemelt et al., SCANNING-TUNNELING-MICROSCOPY WITH ATOMIC-RESOLUTION ON RES2 SINGLE-CRYSTALS GROWN BY VAPOR-PHASE TRANSPORT - REPLY, Annalen der Physik, 2(8), 1993, pp. 758-759
Citations number
3
Categorie Soggetti
Physics
Journal title
Volume
2
Issue
8
Year of publication
1993
Pages
758 - 759
Database
ISI
SICI code