SECONDARY-ION MASS-SPECTROMETRY STUDIES ON THE FORMATION OF THE VALVEMETAL-OXIDE IN RUTHENIUM-BASED AND IRIDIUM-BASED MIXED-OXIDE ELECTRODES

Citation
S. Daolio et al., SECONDARY-ION MASS-SPECTROMETRY STUDIES ON THE FORMATION OF THE VALVEMETAL-OXIDE IN RUTHENIUM-BASED AND IRIDIUM-BASED MIXED-OXIDE ELECTRODES, International journal of mass spectrometry and ion processes, 152(1), 1996, pp. 87-96
Citations number
14
Categorie Soggetti
Spectroscopy,"Physics, Atomic, Molecular & Chemical
ISSN journal
01681176
Volume
152
Issue
1
Year of publication
1996
Pages
87 - 96
Database
ISI
SICI code
0168-1176(1996)152:1<87:SMSOTF>2.0.ZU;2-X
Abstract
The process of TiO2 evolution from titanium diisopropoxide bis-2,4-pen tanedionate precursor on nickel and titanium supports was followed by secondary ion mass spectrometry, Concentration depth profiles of rutil e (TiO2) al higher temperatures showed completely different patterns f or the two supports, indicating the influence of the base metal on the formation and properties of the oxide coating. The formation and surf ace accumulation of elemental carbon during combustion of the organic matter were followed as a function of temperature, The results obtaine d are in agreement with those of previous measurements by simultaneous thermogravimetry-differential thermal analysis, thermogravimetry comb ined with mass spectrometry and emission FTIR spectrometry.